BIST for discrete - time Sigma - Delta ADC

نویسندگان

  • Emmanuel SIMEU
  • M. J. Barragán
  • R. Alhakim
  • L. Ciganda
  • Y. Zhao
  • S. Mir
  • M. Dubois
  • H. Stratigopoulos
  • H. Le
چکیده

Scientific Test and diagnosis for mixed-signal/RF integrated devices, design-for-test, behavioral and statistical modeling Fields of expertise Microelectronics, control, statistics Know-how Test metrics estimation, machine-learning-based test, parameter estimation for test and control, diagnosis, mixed-signal/RF design-for-test Industrial transfer Techniques of integrated test for analog-to-digital signal converters, CAD software for test, embedded sensors diagnostic technique

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تاریخ انتشار 2014